Instrumented nanoindentation and scanning electron transmission microscopy applied to the study of the adhesion of InP membranes heteroepitaxially bonded to Si

Author： Pantzas Konstantinos   Le Bourhis Eric   Patriarche Gilles   Itawi Ahmad   Beaudoin Grégoire   Sagnes Isabelle   Talneau Anne  

Publisher： Edp Sciences

E-ISSN： 1286-0050|65|2|20702-20702

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.65, Iss.2, 2014-02, pp. : 20702-20702

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