Local current conduction due to edge dislocations in deformed GaN studied by scanning spreading resistance microscopy

Author： Yokoyama Takashi   Kamimura Yasushi   Edagawa Keiichi   Yonenaga Ichiro  

Publisher： Edp Sciences

E-ISSN： 1286-0050|61|1|10102-10102

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.61, Iss.1, 2013-01, pp. : 10102-10102

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