Compensation of loss to approach –1 effective index by gain in metal-dielectric stacks

Author： Zhang J.   Jiang H.   Gralak B.   Enoch S.   Tayeb G.   Lequime M.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|46|3|32603-32603

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.46, Iss.3, 2008-07, pp. : 32603-32603

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