A new calculation approach for dielectric space charge characterization from nano to macro-scales by the thermal step method

Author: Belgaroui E.   Kallel A.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|51|3|30604-30604

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.51, Iss.3, 2010-09, pp. : 30604-30604

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Abstract