Characteristic impedance extraction of embedded and integrated interconnects

Author: Roullard J.   Capraro S.   Lacrevaz T.   Gallitre M.   Bermond C.   Farcy A.   Fléchet B.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|53|3|33605-33605

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.53, Iss.3, 2011-02, pp. : 33605-33605

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Abstract