Electronic structure of aluminum oxide: ab initio simulations of α and γ phases and comparison with experiment for amorphous films

Author： Perevalov T. V.   Gritsenko V. A.   Kaichev V. V.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|52|3|30501-30501

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.52, Iss.3, 2010-11, pp. : 30501-30501

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