Carrier lifetime influence on clamped silicon wafer resonance by PTA effect

Author: Chapus C.   Augereau F.   Podlecki J.   Lévêque G.   Foucaran A.   Attal J.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|50|3|30301-30301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.50, Iss.3, 2010-04, pp. : 30301-30301

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Abstract