Pressure effect on the structural and elastic properties of ternary compounds M₂AlC (M = Ti, V, Nb, and Ta); ab initio study

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Integration of microwave termination based on TaN thin films on ferrite substrates

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EPJ Applied Physics (The), Vol. 72, Iss. 1, 2015-09 ,pp. : 10101-10101

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Measurements of ⁸⁹Y(n,2n)⁸⁸Y and ⁸⁹Y(n,3n)⁸⁷Y, ^87mY cross sections for fast neutrons at KIRAMS

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EPJ Web of Conference, Vol. 146, Iss. issue, 2017-09 ,pp. : 11026-11026

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Comparative study of structural and morphological properties of nanostructured CuIn_2n+1S_3n+2 (n = 0, 1 and 2) thin films produced by oblique angle deposition

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AlGaN/GaN MOS-HFETs based on InGaN/GaN MQW structures with Ta₂O₅ dielectric

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