Author: Absil E. Tessier G. Fournier D. Gross M. Atlan M.
Publisher: Edp Sciences
E-ISSN: 1286-0050|47|1|12704-12704
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.47, Iss.1, 2009-05, pp. : 12704-12704
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Calibration and validation of full-field techniques
By Hack E.
EPJ Web of Conference, Vol. 6, Iss. issue, 2010-06 ,pp. :
A Difraction Element Used to Evaluate the Depth of Bedding of Nano-Sized Radiating Objects
EPJ Web of Conference, Vol. 103, Iss. issue, 2015-09 ,pp. :