Ultra-high precision CMMs and their associated tactile or/and optical scanning probes

Author： Nouira H.   Bergmans R.H.   Küng A.   Piree H.   Henselmans R.   Spaan H.A.M.  

Publisher： Edp Sciences

E-ISSN： 2107-6847|5|2|204-204

ISSN： 2107-6839

Source： International Journal of Metrology and Quality Engineering, Vol.5, Iss.2, 2014-10, pp. : 204-204

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