Author: Kruger O. Hungwe F. Farid N. Schreve K.
Publisher: Edp Sciences
E-ISSN: 2107-6847|5|4|408-408
ISSN: 2107-6839
Source: International Journal of Metrology and Quality Engineering, Vol.5, Iss.4, 2014-12, pp. : 408-408
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
New experiments with a double crystal electron interferometer
EPJ Applied Physics (The), Vol. 78, Iss. 1, 2017-04 ,pp. :
Design and analysis of single- ended robust low power 8T SRAM cell
MATEC Web of conference, Vol. 57, Iss. issue, 2016-05 ,pp. :