Publisher: Edp Sciences
E-ISSN: 1764-7177|05|C1|C1-199-C1-203
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.05, Iss.C1, 1995-01, pp. : C1-199-C1-203
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Defects in nitride-based semiconductors probed by positron annihilation
Journal of Physics: Conference Series , Vol. 505, Iss. 1, 2014-04 ,pp. :
Defects in vitreous SiO
Le Journal de Physique IV, Vol. 03, Iss. C4, 1993-09 ,pp. :
Physical properties of epoxy and free volume evaluated by positron annihilation spectroscopy
Le Journal de Physique IV, Vol. 03, Iss. C4, 1993-09 ,pp. :