RECENT RESULTS IN THE THEORETICAL DESCRIPTION OF CL AND EBIC DEFECT CONTRASTS

Publisher： Edp Sciences

E-ISSN： 1764-7177|01|C6|C6-39-C6-44

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.01, Iss.C6, 1991-12, pp. : C6-39-C6-44

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

RECONSTRUCTION OF THE DEFECT GEOMETRY BY SIMULTANEOUS EBIC/CL MEASUREMENTS ; THEORY AND EXPERIMENTAL RESULTS

By  

Le Journal de Physique Colloques, Vol. 50, Iss. C6, 1989-06 ,pp. : C6-167-C6-167

Edp Sciences

Access to resources Recommend Favorite

NUMERICAL ANALYSIS OF THE TEMPERATURE DEPENDENCE OF EBIC AND CL CONTRASTS

By  

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-23-C6-28

Edp Sciences

Access to resources Recommend Favorite

DISCUSSION OF THE CONVERGENCE PROPERTIES OF THE PERTURBATION SERIES USED IN THE CALCULATION OF EBIC- AND CL-CONTRASTS

By  

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-45-C6-50

Edp Sciences

Access to resources Recommend Favorite

EBIC AND CL STUDY OF LASER DEGRADATION

By  

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-317-C6-322

Edp Sciences

Access to resources Recommend Favorite

SEM MICROCHARACTERIZATION OF SEMICONDUCTORS BY EBIC AND CL

By  

Le Journal de Physique Colloques, Vol. 50, Iss. C6, 1989-06 ,pp. : C6-3-C6-14

Edp Sciences

Access to resources Recommend Favorite