TEM and EXAFS study of Ar+ implanted Mo thin films

Publisher: Edp Sciences

E-ISSN: 1764-7177|04|C3|C3-273-C3-277

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.04, Iss.C3, 1994-02, pp. : C3-273-C3-277

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