Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique

Publisher: Edp Sciences

E-ISSN: 1764-7177|03|C3|C3-177-C3-182

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.03, Iss.C3, 1993-08, pp. : C3-177-C3-182

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