Publisher: Edp Sciences
E-ISSN: 1764-7177|03|C3|C3-163-C3-170
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.03, Iss.C3, 1993-08, pp. : C3-163-C3-170
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
MORPHOLOGICAL CHARACTERIZATION OF SiC MATERIALS
Le Journal de Physique Colloques, Vol. 47, Iss. C1, 1986-02 ,pp. :
Characterization of Buffer Layers for SiC CVD
Le Journal de Physique IV, Vol. 05, Iss. C5, 1995-06 ,pp. :
Luminescence of SiC films grown by a vapor phase reaction
Journal of Physics: Conference Series , Vol. 281, Iss. 1, 2011-02 ,pp. :