In-situ scanning tunneling microscopy of the semiconductor-electrolyte interface

Publisher： Edp Sciences

E-ISSN： 1764-7177|04|C1|C1-323-C1-327

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.04, Iss.C1, 1994-01, pp. : C1-323-C1-327

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