XAFS Studies of Self-Aligned Platinum Silicide Thin Films at the Pt M3,2 Edge and the Si K-Edge

Publisher： Edp Sciences

E-ISSN： 1764-7177|7|C2|C2-1131-C2-1132

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.7, Iss.C2, 1997-04, pp. : C2-1131-C2-1132

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