Characterization of microstructural defects from temperature dependence of domain wall coercive field

E-ISSN： 1764-7177|08|PR2|Pr2-307-Pr2-310

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.08, Iss.PR2, 1998-06, pp. : Pr2-307-Pr2-310

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