Plant for high-temperature X-ray analysis from 20° to 2700 °C in the air and crystal structure bias features detected in phase junction fields

Publisher： Edp Sciences

E-ISSN： 1764-7177|09|PR3|Pr3-463-Pr3-466

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.09, Iss.PR3, 1999-03, pp. : Pr3-463-Pr3-466

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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