Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites

Publisher： Edp Sciences

E-ISSN： 1764-7177|10|PR6|Pr6-97-Pr6-103

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.10, Iss.PR6, 2000-04, pp. : Pr6-97-Pr6-103

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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