GAXRD and in situ X-ray diffraction characterizations of the yttrium implantation effect on pure iron oxidation at high temperature

Publisher： Edp Sciences

E-ISSN： 1764-7177|12|6|417-426

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.12, Iss.6, 2002-07, pp. : 417-426

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