Publisher: Edp Sciences
E-ISSN: 1160-8161|23|S12|215-216
ISSN: 1160-8161
Source: Journal de Physique Appliqué, Vol.23, Iss.S12, 1962-12, pp. : 215-216
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Transient surface grating technique for thermal diffusivity measurement
Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. :
MEASUREMENT OF THERMAL DIFFUSIVITY OF REACTION BONDED SILICON NITRIDE
Le Journal de Physique Colloques, Vol. 47, Iss. C1, 1986-02 ,pp. :
Thermal surface wave technique for thin film thermal diffusivity measurement
Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. :