Conduction and charge storage in Cr-thin SiO2-pSi structures

Publisher： Edp Sciences

E-ISSN： 0035-1687|19|4|343-347

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.19, Iss.4, 1984-04, pp. : 343-347

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