Publisher： Edp Sciences
E-ISSN： 0035-1687|22|8|789-795
ISSN： 0035-1687
Source： Revue de Physique Appliquée (Paris), Vol.22, Iss.8, 1987-08, pp. : 789-795
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Electron–phonon coupling at surfaces and interfaces
New Journal of Physics, Vol. 11, Iss. 12, 2009-12 ,pp. :
Access to resources
Recommend
X-ray characterization of semiconductor surfaces and interfaces
Journal de Physique III, Vol. 4, Iss. 9, 1994-09 ,pp. :
Access to resources
Electron recombination with multicharged ions via chaotic many-electron states
Journal of Physics: Conference Series , Vol. 635, Iss. 5, 2015-09 ,pp. :
THEORY OF ELECTRON-PHONON INTERACTION AND BROKEN SYMMETRIES OF SEMICONDUCTOR INTERFACES
Le Journal de Physique Colloques, Vol. 45, Iss. C5, 1984-04 ,pp. :
COMPUTER SIMULATION OF METAL-SEMICONDUCTOR AND SEMICONDUCTOR-SEMICONDUCTOR INTERFACES
Le Journal de Physique Colloques, Vol. 51, Iss. C1, 1990-01 ,pp. :