ELECTROMIGRATION IN THIN FILMS : THE EFFECT OF SOLUTE ATOMS ON GRAIN BOUNDARY DIFFUSION

Publisher： Edp Sciences

E-ISSN： 0449-1947|36|C4|C4-191-C4-199

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.36, Iss.C4, 1975-10, pp. : C4-191-C4-199

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