EuS THIN FILM PROPERTIES IN RELATION TO STOICHIOMETRY AND DEFECTS

Publisher： Edp Sciences

E-ISSN： 0449-1947|41|C5|C5-127-C5-129

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.41, Iss.C5, 1980-07, pp. : C5-127-C5-129

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