CHARACTERIZATION OF OXIDE FILMS ON Fe-Cr-Al ALLOYS AND RF-SPUTTERED FILMS BY SOFT X-RAY SPECTROSCOPY AND MICROANALYSIS

Publisher： Edp Sciences

E-ISSN： 0449-1947|45|C2|C2-653-C2-656

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.45, Iss.C2, 1984-02, pp. : C2-653-C2-656

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