A PARAMETERLESS METHOD TO CORRECT FOR X-RAY ABSORPTION AND FLUORESCENCE I N THIN FILM MICROANALYSIS

E-ISSN： 0449-1947|45|C2|C2-411-C2-414

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.45, Iss.C2, 1984-02, pp. : C2-411-C2-414

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Fluorescence Detection of Extended X-Ray Absorption Fine Structure in Thin Films

Journal de Physique III, Vol. 7, Iss. 2, 1997-02 ,pp. : 337-349

Edp Sciences

Access to resources Recommend Favorite

Correction method for self-absorption effects of fluorescence x-ray absorption near-edge structure on multilayer samples

By Li Wen-bin Yuan Xiao-feng Zhu Jing-tao Zhu Jie Wang Zhan-shan

Physica Scripta, Vol. 90, Iss. 1, 2015-01 ,pp. : 15804-15808

IOP Publishing

Access to resources Recommend Favorite

STEM-EDS X-RAY MICROANALYSIS IN THIN METAL FOILS

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-381-C2-386

Edp Sciences

Access to resources Recommend Favorite

In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures

Journal of Physics: Conference Series , Vol. 190, Iss. 1, 2009-11 ,pp. : 660-665

IOP Publishing

Access to resources Recommend Favorite

A model for the X-ray absorption in Compton-thin AGN

Astronomy & Astrophysics, Vol. 449, Iss. 2, 2006-04 ,pp. : 551-558

Edp Sciences

Access to resources Recommend Favorite