AES AND EELS MEASUREMENTS ON THE Si-Au-Ag INTERFACE

Publisher: Edp Sciences

E-ISSN: 0449-1947|42|C4|C4-1081-C4-1083

ISSN: 0449-1947

Source: Le Journal de Physique Colloques, Vol.42, Iss.C4, 1981-10, pp. : C4-1081-C4-1083

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