THIN FILM COMPOSITIONAL ANALYSIS BY LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY (LEEIXS). NEW APPLICATIONS

Publisher： Edp Sciences

E-ISSN： 0449-1947|48|C9|C9-87-C9-90

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.48, Iss.C9, 1987-12, pp. : C9-87-C9-90

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