INTERFACIAL DEFECTS IN GaAs/Si AFTER ANNEALING

Publisher： Edp Sciences

E-ISSN： 0449-1947|51|C1|C1-915-C1-920

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.51, Iss.C1, 1990-01, pp. : C1-915-C1-920

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