STUDY OF FIELD INDUCED HOT-ELECTRON EMISSION USING THE COMPOSITE MICROEMITTERS WITH VARYING DIELECTRIC LAYER THICKNESS

Publisher： Edp Sciences

E-ISSN： 0449-1947|48|C6|C6-115-C6-120

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.48, Iss.C6, 1987-11, pp. : C6-115-C6-120

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