GROWTH OF THIN SINGLE CRYSTAL NiSi2 FILMS OF Si SURFACES, A FIELD ION MICROSCOPE STUDY

Publisher： Edp Sciences

E-ISSN： 0449-1947|47|C2|C2-315-C2-319

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.47, Iss.C2, 1986-03, pp. : C2-315-C2-319

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

ION BEAM MIXING OF Fe30Ni70-Si MULTILAYER THIN FILMS : AN F.M.R. AND A STRUCTURAL STUDY

By  

Le Journal de Physique Colloques, Vol. 49, Iss. C8, 1988-12 ,pp. : C8-1715-C8-1716

Edp Sciences

Access to resources Recommend Favorite

Restricted conformation dynamics of single functionalized perylene bisimide molecules on SiO2 surfaces and in thin polymer films

By Kowerko Danny   Schuster Jorg   von Borczyskowski Christian  

Molecular Physics, Vol. 107, Iss. 18, 2009-01 ,pp. : 1911-1921

Taylor & Francis Ltd

Access to resources Recommend Favorite

Single crystal growth and physical properties of YbPd2Si2

By  

Journal of Physics: Conference Series , Vol. 592, Iss. 1, 2015-03 ,pp. : 125-128

IOP Publishing

Access to resources Recommend Favorite

Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi2 formation at low temperature

By  

Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. : 279-282

IOP Publishing

Access to resources Recommend Favorite