Publisher: Edp Sciences
E-ISSN: 0449-1947|50|C6|C6-181-C6-181
ISSN: 0449-1947
Source: Le Journal de Physique Colloques, Vol.50, Iss.C6, 1989-06, pp. : C6-181-C6-181
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
On the temperature dependence of the EBIC contrast of dislocations in silicon
Journal de Physique, Vol. 47, Iss. 2, 1986-02 ,pp. :
THE TEMPERATURE DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON
Le Journal de Physique Colloques, Vol. 44, Iss. C4, 1983-09 ,pp. :
EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
Experimental temperature measurements by echo-contrast agents
By Svet V. Galybin N. Bakulin E.
Acoustical Physics, Vol. 55, Iss. 4-5, 2009-10 ,pp. :