Publisher: Edp Sciences
E-ISSN: 0449-1947|51|C1|C1-423-C1-428
ISSN: 0449-1947
Source: Le Journal de Physique Colloques, Vol.51, Iss.C1, 1990-01, pp. : C1-423-C1-428
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
EBIC AND DLTS MEASUREMENTS OF SI-AND POLYCRYSTALLINE SILICON
Le Journal de Physique Colloques, Vol. 49, Iss. C5, 1988-10 ,pp. :
CHARACTERIZATION OF POLYCRYSTALLINE SILICON BY EBIC
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
EBIC MEASUREMENTS OF ANNEALED SILICON BICRYSTALS
Le Journal de Physique Colloques, Vol. 50, Iss. C6, 1989-06 ,pp. :
EBIC and conductance measurements in poly- and bicrystalline silicon
Revue de Physique Appliquée (Paris), Vol. 22, Iss. 7, 1987-07 ,pp. :