ASPECTS OF ELECTRON PROBE MICROANALYSIS APPLIED TO THE CHARACTERIZATION OF COATINGS

E-ISSN： 0449-1947|50|C5|C5-285-C5-294

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.50, Iss.C5, 1989-05, pp. : C5-285-C5-294

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

HISTORY OF QUANTITATIVE ELECTRON PROBE MICROANALYSIS

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-3-C2-8

Edp Sciences

Access to resources Recommend Favorite

ELECTRON PROBE MICROANALYSIS OF SUBMICRON ALLOY FILMS

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-621-C2-624

Edp Sciences

Access to resources Recommend Favorite

QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF CARBON IN CARBIDES USING A GAUSSIAN ϕ( ρz) EQUATION

Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. : C2-609-C2-612

Edp Sciences

Access to resources Recommend Favorite

ATOM PROBE MICROANALYSIS OF THE METALLIC GLASSES

Le Journal de Physique Colloques, Vol. 49, Iss. C6, 1988-11 ,pp. : C6-317-C6-322

Edp Sciences

Access to resources Recommend Favorite

Some electron probe X-ray microanalysis (EPMA)- and (BPES)-related physical investigations on ZnSSe thin-films growth composition-related kinetics

By Fridjine S. Boubaker K. Amlouk M.

Canadian Journal of Physics, Vol. 87, Iss. 6, 2009-06 ,pp. : 653-657

NRC Research Press

Access to resources Recommend Favorite