Systematic tests for position-dependent additive shear bias

Author: van Uitert Edo   Schneider Peter  

Publisher: Edp Sciences

E-ISSN: 1432-0746|595|issue|A93-A93

ISSN: 0004-6361

Source: Astronomy & Astrophysics, Vol.595, Iss.issue, 2016-11, pp. : A93-A93

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Abstract