Benefits of Considering More than Temperature Acceleration for GaN HEMT Life Testing

Author： Coutu Ronald A.   Lake Robert A.   Christiansen Bradley D.   Heller Eric R.   Bozada Christopher A.   Poling Brian S.   Via Glen D.   Theimer James P.   Tetlak Stephen E.   Vetury Ramakrishna   Shealy Jeffrey B.  

Publisher： MDPI

E-ISSN： 2079-9292|5|3|32-32

ISSN： 2079-9292

Source： Electronics, Vol.5, Iss.3, 2016-06, pp. : 32-32

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