An in situ atomic force microscope for normal‐incidence nanofocus X‐ray experiments
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5775|23|5|1110-1117
ISSN： 0909-0495
Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.23, Iss.5, 2016-09, pp. : 1110-1117
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