Complex XPS and Raman Study of Graphene on Copper and Si/SiO2 Subjected to Ar Ion Treatment

Publisher: Trans Tech Publications

E-ISSN: 1662-9795|2016|721|258-262

ISSN: 1013-9826

Source: Key Engineering Materials, Vol.2016, Iss.721, 2017-02, pp. : 258-262

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Abstract