Semi-analytic parameter identification for complex yield functions

Author: Küsters Niklas  

Publisher: Edp Sciences

E-ISSN: 2261-236x|80|issue|10002-10002

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.80, Iss.issue, 2016-10, pp. : 10002-10002

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract