NI Based System for Seu Testing of Memory Chips for Avionics

Publisher: Edp Sciences

E-ISSN: 2261-236x|79|issue|01028-01028

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.79, Iss.issue, 2016-10, pp. : 01028-01028

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract