Anelastic Mechanical Behavior Measurement of thin Films Using Novel Beam deflection Method

Author: Tong C.-J.  

Publisher: Edp Sciences

E-ISSN: 2100-014x|6|issue|40007-40007

ISSN: 2100-014x

Source: EPJ Web of Conference, Vol.6, Iss.issue, 2010-06, pp. : 40007-40007

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Abstract