Prediction of power semiconductors devices reliability working in cyclic mode

Author： Kravchenko E.V.  

Publisher： Edp Sciences

E-ISSN： 2100-014x|76|issue|01014-01014

ISSN： 2100-014x

Source： EPJ Web of Conference, Vol.76, Iss.issue, 2014-08, pp. : 01014-01014

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