In-situ determination of the effective absorbance of thin μc-Si:H layers growing on rough ZnO:Al

Author： Meier Matthias   Bittkau Karsten   Paetzold Ulrich W.   Hüpkes Jürgen   Muthmann Stefan   Schmitz Ralf   Mück Andreas   Gordijn Aad  

Publisher： Edp Sciences

E-ISSN： 2105-0716|4|issue|40602-40602

ISSN： 2105-0716

Source： EPJ Photovoltaics, Vol.4, Iss.issue, 2013-10, pp. : 40602-40602

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