

Publisher: Edp Sciences
E-ISSN: 2261-236x|8|issue|02007-02007
ISSN: 2261-236x
Source: MATEC Web of conference, Vol.8, Iss.issue, 2013-11, pp. : 02007-02007
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


High repetition rate Petawatt lasers
EPJ Web of Conference, Vol. 167, Iss. issue, 2018-01 ,pp. :


Use of the Femtosecond Lasers in Ophthalmology
EPJ Web of Conference, Vol. 167, Iss. issue, 2018-01 ,pp. :


Stability of target irradiation for high-repetition rate direct-drive facilities
EPJ Web of Conference, Vol. 59, Iss. issue, 2013-11 ,pp. :


Behaviour of metals at ultra-high strain rate by using femtosecond laser shockwaves
EPJ Web of Conference, Vol. 26, Iss. issue, 2012-08 ,pp. :


Failure Rate Measurement on Silicon Diodes Reverse Polarized at High Temperature
By Osorno D.
E3S Web of conferences, Vol. 16, Iss. issue, 2017-05 ,pp. :