External Second Gate, Fourier Transform Ion Mobility Spectrometry: Parametric Optimization for Detection of Weapons of Mass Destruction

Author： Tarver Edward E.

Publisher： MDPI

E-ISSN： 1424-8220|4|1|1-13

ISSN： 1424-8220

Source： Sensors, Vol.4, Iss.1, 2004-03, pp. : 1-13

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