Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations *

Author： Baker-Jarvis James  

Publisher： MDPI

E-ISSN： 1099-4300|10|4|411-429

ISSN： 1099-4300

Source： Entropy, Vol.10, Iss.4, 2008-10, pp. : 411-429

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