Quantitative Accelerated Life Testing of MEMS Accelerometers

Author: Bâzu Marius   Gălăţeanu Lucian   Ilian Virgil Emil   Loicq Jerome   Habraken Serge   Collette Jean-Paul  

Publisher: MDPI

E-ISSN: 1424-8220|7|11|2846-2859

ISSN: 1424-8220

Source: Sensors, Vol.7, Iss.11, 2007-11, pp. : 2846-2859

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Abstract